Fractilia, the industry leader in high-accuracy stochastics metrology and control, today announced that its FAME 300(TM) system has been adopted for production use by a top-five semiconductor device ...
Stochastic volatility models generate an implied volatility surface as well as its associated dynamics. While Monte Carlo simulation is always an option, a fast and accurate approximation of the ...
Several vendors are rolling out next-generation inspection systems and software that locates problematic defects in chips caused by processes in extreme ultraviolet (EUV) lithography. Each defect ...
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