Figure | Working principle of Interferometric Image Scanning Microscopy (iISM). (a) Schematic of the iISM microscope and interferometric PSF detection. (b) iISM with adaptive pixel-reassignment (APR) ...
Physicists in Leiden have built a microscope that can measure no fewer than four key properties of a material in a single scan, all with nanoscale precision. The instrument can even examine complete ...
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